Bruker Nano provides Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM) products that stand out from other commercially available systems for their robust design and ease-of-use, whilst maintaining the highest resolution.
Unique features of the NANOS AFM / SPM microscope products include:
- These Microscope/Scanning Probe Microscope (AFM/SPM) products can be operated by users with introductory training only yet offer all modes and options required for advanced research
- Microscopes cover the range from large scan areas (combined with traceable AFM (optional)) to highest resolution
- are available in versions for samples up to 300 mm diameter
- The NANOS AFM / SPM microscopes provide fast and easy navigation
- They an be upgraded with other techniques, e.g. Raman, confocal microscopy
- These microscopes can be combined with your existing optical/confocal/interferometric microscope, or similar inspection tools
- Fiber optic interferometry for calibrated cantilever deflection measurements